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Scanning probe microscope

A XE-100 AFM system from ST Instruments (Park systems) was purchased in 2011. The instrument can be operated to  image topography and friction on small and medium size samples both in air and in liquid.  The instrument consists of completely decoupled XY & Z scanners by using flexure guided scan system for all three axes, closed/open-loop scan,  XY flexure scanner with zero background curvature, motorized Z stage, motorized focus stage,  precision motorized XY sample stage and direct on-axis optics. The system also include high resolution digital CCD camera with digital zoom. (Sponsored by The Knut and Alice Wallenberg Foundation.)

 

 

Contact

Contact person: Axel Rüter
Operationally responsible: Asger Björn Petersen.
Conditions for use: Training is compulsory for unassisted use of the instrument.
Booking: Contact Asger Björn Petersen
External users: Contact Axel Rüter for information about fees.