Scanning probe microscope
A XE-100 AFM system from ST Instruments (Park systems) was purchased in 2011. The instrument can be operated to image topography and friction on small and medium size samples both in air and in liquid. The instrument consists of completely decoupled XY & Z scanners by using flexure guided scan system for all three axes, closed/open-loop scan, XY flexure scanner with zero background curvature, motorized Z stage, motorized focus stage, precision motorized XY sample stage and direct on-axis optics. The system also include high resolution digital CCD camera with digital zoom. (Sponsored by The Knut and Alice Wallenberg Foundation.)